Quantum information technologies require placing quantum dots with incredible precision—within just 10 to 20 nanometers (one-thousandth the width of a human hair) relative to other photonic components on the chip. An incompatibility will significantly reduce the performance of the device.
Researchers at the National Institute of Standards and Technology (NIST) have developed a solution, a method for calibrating optical microscopes to achieve this level of accuracy. This “traceable microscopy” ensures that measurements conform to the International System of Units (SI), the standard for scientific measurement.
Researchers use a special grid of nano-sized holes to detect and correct errors in microscope magnification and image distortion. A new standard made of silicon, a material well known to shrink at low temperatures, is being used to calibrate microscopes that operate at the ultra-low temperatures needed to produce quantum dots.
The impact of this method extends beyond quantum information technology. Tracking microscopy can improve the accuracy and reliability of other complex optical microscopy applications, such as examining brain cells and their connections.
Source: Ferra
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