Russian scientists develop a way to control electrical circuitsScience and technology22:13 | 23 May 2023

st. Petersburg State Electrotechnical University (LETI) have developed a new method for controlling the production of photonic integrated circuits (PICs) used in modern electronic devices. This method provides precise control of FIS parameters during their manufacture without damaging the samples. Research in the field of radio photonics, which explores the generation, transmission and processing of signals using optical radiation, is increasingly shifting from theoretical studies to practical applications. Radio photonics allows you to create more compact and efficient electronic devices than conventional electronics.

Photonic integrated circuits are the basis for the development of radio photonic devices. They are made on the basis of semiconductor materials and can contain thousands of components assembled in photonic integrated devices (chips). But during production, deviations from the specified parameters occur, which can lead to non-compliance with the requirements. Diagnostic methods are used to check FIS parameters, but most of them are associated with damage or destruction of samples.

ETU “LETI” scientists have developed a non-destructive method for quality control of FIS based on the measurement and analysis of transfer properties. To do this, miniature test elements are placed on plates with photonic integrated circuits, through which optical radiation is carried out. Then the indicators characterizing the optical parameters of the schemes are measured and the data obtained are analyzed. In this way, scientists can identify flaws and inconsistencies in FIS production.

This method has already been successfully applied to determine the parameters of FICs fabricated using silicon-on-insulator technology used in industry. The results obtained were in agreement with the experimental data confirming the effectiveness of the new method. Scientists believe that this method can be widely applied in the development of technological processes and quality control in the microelectronics and optoelectronics industries.

This development can improve the quality and efficiency of the production of photonic integrated circuits used in modern electronic devices. The new control method allows parameters to be controlled with high accuracy without damaging the samples. The results of this work are of great practical importance for the photonic integrated circuits industry and may contribute to their further development and application in various fields of electronics.