Scientists from North Ossetian State University (NOSU) have created a new detector that significantly improves the performance of the scanning electron microscope. This was reported in the press service of the Ministry of Education and Science of Russia. Now researchers will be able to get more information about the subject they are working on using this device.
A traditional scanning electron microscope is excellent at showing the surface of a sample but cannot look deeper than 1 micrometer. A new X-ray bremsstrahlung detector adds this feature, allowing the structure of a sample to be seen below the surface. It works like this: An electron beam penetrates the sample and stops, resulting in the emergence of Bremsstrahlung X-rays. In essence, the sample begins to “shine”, which makes it possible to illuminate it as in fluorography.
With the help of this development, scientists will be able to deepen their research and obtain more complete data about the studied objects. This situation opens new horizons for scientific experiments and analysis.
Source: Ferra
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